James S. Lewis, M.D.

Dr. James (Jim) Lewis, Jr., is a board-certified surgical pathologist with 20 years of practice experience. He completed medical school at Washington University in St. Louis and then completed AP/CP residency and general surgical pathology fellowships there. He was an attending pathologist at Washington University for 9 years followed by 9 years as attending at Vanderbilt University Medical Center. He specializes in head and neck and endocrine pathology with a focus on squamous cell carcinoma, human papillomavirus, and sinonasal diseases.

He has three major areas of academic focus. The first is on HPV in head and neck carcinomas with particular focus on testing and application in routine practice, on detection methods, morphology, and prognosis. The second is in using computerized image analysis of digitized pathology slides for prognosis in oropharyngeal and oral cavity squamous cell carcinoma patients, for which he is Co-PI on two funded R01 grants through the NIH. The third area of interest is in 3D imaging of head and neck resection specimens for margin assessment, documentation, and communication.